The M4DT Follow Up&Support Group have decided to organize each last Thursday of the month a broader M4DT activity, the event in which the people who are interested in the digital transformation meet, inviting interested colleagues of the SIM region to a 120 minutes presentation, discussion, and exchange on M4DT topics.
This month, the topic will be related to Cloud Technologies, on Thursday February 24th, 2022 at 15h00 UTC.
Agenda
| Time (UTC) | Topic | Facilitator |
|---|---|---|
|
14h55 |
Connecting |
Hugo Gasca CENAM - México |
|
15h00 |
Start of the M4DT Day |
|
|
15h05 |
Welcome words and introduction to the day |
Rodolfo Souza Inmetro - Brasil |
|
15h10 |
QR Code for Legal Metrology applications |
Bruno Erthal Inmetro - Brasil |
|
15h35 |
Q&A / Exchange Presentation 1 |
|
|
15h45 |
Blockchain and Digital certification applications in cloud |
Jean Martina UFSC - Brasil |
|
16h10 |
Q&A / Exchange Presentation 2 |
|
|
16h20 |
Ideas and efforts to realize a digital SI |
Jeff Gust Fluke |
|
16h45 |
Q&A / Exchange Presentation 3 |
|
|
16h55 |
Closing Words & Comments |
Hugo Gasca CENAM - México |
Speakers
Meet our speakers.
We will continue to add speaker details to this page as we get closer to the event.
Bruno Erthal de Abreu
Division of Legal Metrology Supervision - InmetroBachelor in Computer Science - Universidade Federal Fluminense
Master in Metrology and Quality - Inmetro
Head of the Division of Legal Metrology Supervision at Inmetro
Jean E. Martina
Senior Lecturer and Researcher at LabSEC Universidade Federal de Santa CatarinaHe is currently a Senior Lecutrer and Researcher at LabSEC (Computer Security Laboratory) – Universidade Federal de Santa Catarina. He is currently working on authentication protocols for telemedicine environments, on the formalisation of security ceremonies, the desing of IoT-tailored security protocols and Blockchain Applications. Jean is also a visiting lecturer in Computer Science at University of Hertfordshire working mainly as project supervisor for B.Sc. and M.Sc degrees.
Jeff C. Gust
Chief Corporate Metrologist and Senior Director of Regulatory at FlukeMr. Jeff Gust is the Chief Corporate Metrologist and Senior Director of Regulatory, Compliance and Metrology at Fluke. Since joining in 2010, he has driven improvements in measurement quality for engineering, manufacturing, and service activities for Fluke and Fortive organizations around the world. He was a writing group member for ISO/IEC 17043:2010, ISO/IEC 17025:2017 and ILAC P14:09/2020. In 2011 Jeff was recognized by the Measurement Science Conference for outstanding contributions and leadership in metrology, and in 2017 was named a Fluke Fellow, the highest technical award for the company. Prior to joining Fluke, Jeff has co-authored publications with NIST and served as a consultant to NIST and UNIDO. Jeff has a bachelor’s degree from Purdue University in physics.
Presentations
Look back at our talks.