M4DT Conference 2024

MS Teams
m4dt-sim 2024 Conference

👋SIM-MWG-14 invites you to participate in the annual conference 2024 “Metrology for Digital Transformation” to be held virtually on October 9th and 10th, 2024.

Digital transformation is an increasingly important process for the competitiveness of countries and the generation of social and economic welfare. This requires not only the development of technology, but also the establishment of mechanisms for collaboration and coordination between public, private and civil society actors in the digital environment, through a systemic and comprehensive approach that ensures the generation of public value and promotes the generation of economic and social value for citizens, businesses, organizations and society in general.

The digital transformation in metrology enhances and multiplies the impact of metrology and opens new possibilities for metrological development and innovation. Furthermore, metrology is expected to undergo a transformation with significant changes in its concepts, in its services and in the use and application by different users.

It is necessary to know the advances and challenges that occur in the different actors of the metrological field in an environment of digital transformation. Therefore, we invite not only National Metrology Institutes, but also calibration laboratories and industry to share and exchange their experiences and advances.

This year the conference will focus on the following topics:

Digital Quality Infrastructure

Digital Metrological traceability

BIPM Forum Metrology and Digitalization

Metrology for AI

🕑 We look forward to seeing you on October 9th and 10th , 2024 from 15:00 to 18:00 UTC.

Agenda



Time (UTC) Topic Speaker

15h00

Welcome and opening

Javier Arias

SIM President

15h05

Introduction to the block: “1st BLOCK” Digital Quality Infrastructure

Alexis Valqui

International QI Expert

15h10

Accreditation for Digital Transformation: Opportunities and Challenges.

Presentation

Carlos EchevarrĂ­a

SAE

15h30

Advancing Digital Transformation in the Americas: Collaborative Efforts in QICA

Presentation

Kory Eguino

COPANT

15h50

Standardization and Accreditation in Digital Quality Infrastructure: A Measurement Science Perspective

Presentation

Blair Hall

Chair of APMP - New Zealand

16h10

Q&A

Alexis Valqui

International QI Expert

16h25

Coffee break

16h40

Introduction to the block: “2nd BLOCK” BIPM Forum Metrology and Digitalization

HĂ©ctor Laiz

INTI - Argentina

16h45

Secure and Trustworthy AI

Presentation

Louise Wright

NPL - United Kingdom

17h05

Harmonizing DCC and DRMC

Presentation

Martin Koval

CMI - Czech Republic

17h25

FAIR for Metrology

Presentation

Robert Hanisch

NIST - USA

17h45

Q&A and Closing Remarks

HĂ©ctor Laiz

INTI, Argentina


Time (UTC) Topic Speaker

15h00

Welcome and opening

Rodolfo Souza

CAHIR SIM-MWG14-M4DT

15h05

Introduction to the block: “3rd BLOCK” Digital metrological traceability

James Fedchak

NIST - USA

15h10

Traceability challenges for intrinsic, deployable standards

Presentation

Barbara Goldstein

NIST - USA

15h30

Provenance in the context of metrological traceability

Presentation

Ryan White

NRC - CANADA

15h50

Metrological Timelines for visualizing and digitalizing metrological traceability

Presentation

Charles Ehrlich

NIST - USA

16:10

Q&A

James Fedchak

NIST - USA

16h25

Coffee break

16h40

Introduction to the block: “4th BLOCK” Metrology for AI

Rodolfo Souza

CAHIR SIM-MWG14-M4DT

16h45

Historical Perspective of AI and the impact of IA in Metrology

Rodolfo Souza

INMETRO - Brazil

17h05

Explainable tinyml: creating distributed knowledge in industry 5.0

Presentation

Claudio Miceli

INMETRO, Brazil

17h25

Q&A and Closing Remarks

Rodolfo Souza

INMETRO, Brazil

Spanish

Broadcast Spanish

Day 1 - October 9th


Day 2 - October 10th

English

Broadcast English

1st Block - Digital Quality Infrastructure


2nd Block BIPM forum Metrology Digitalization


3rd Block Digital Metrological Traceability


4th Block Metrology For AI

Speakers

Meet our speakers.

We will continue to add speaker details to this page as we get closer to the event.

Alexis Valqui
International QI Expert
Javier Arias
SIM
Carlos Echeverria
SAE, Ecuador
Blair Hall
New Zealand
HĂ©ctor Laiz
INTI - Argentina
Louise Wright
NPL - United Kingdom
Robert Hanisch
NIST - USA
Rodolfo Souza
INMETRO, Brazil
James Fedchak
NIST - USA
Ryan White
NRC - CANADA
Charles Ehrlich
NIST - USA
Barbara Goldstein
NIST - USA
Martin Koval
CMI – Czech Republic
Claudio Miceli
UFRJ - Brazil